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“From an industrial point of view, our collaboration with B-Phot is interesting, because they have no problem meeting deadlines..."

Metrology

The instrumentation and metrology platform has comprehensive competence in optical metrology in general, and in quantitative optical measurements and measurement standards in particular. This team has at its disposal a clean room infrastructure equipped with a unique assortment of top-measurement instrumentation for the quantitative characterization of optical materials, surfaces and micro-photonic components. It provides measurement services to B-PHOT’s strategic research teams, to other VUB research teams, to European research institutes and university teams, and to industry. The expertise of this team comprises e.g. benchmarking of measurement instrumentation, round robin measurements, and quality control of a variety of micro-optical components.

   

Metrology portfolio : 

Bruker Contour GT-I Dektak 8 Stylus Contact Profilometer
Dimension 3100 Atomic Force Microscope (with Nanoscope IV SPM control station) Werth UA 400 multisensor coordinate measurement machine
Mach-Zehnder interferometer Twyman-Green interferometer
 
Optical Parametric Oscillator  
Responsible: Heidi Ottevaere
B-PHOT cooperates with EYESTvzw for STEM-projects in Photonics
STEM

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Contact

Hugo Thienpont
Prof. Dr. Ir.
Hugo Thienpont
Managing Director
Nadia Cornand

Nadia Cornand
Secretary
ncornand@b-phot.org
+32 2 791 68 52

How to reach B-Phot?

VUB - Campus Etterbeek
Pleinlaan 2
1050 Elsene
Building F - 9th floor

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