A brighter, lighter and healthier world
Home » Publications » Production of InorganicThin Scintillating Films for Ion Beam Monitoring Devices

Production of InorganicThin Scintillating Films for Ion Beam Monitoring Devices

Publication date 2005
B-Phot Authors Alex Hermanne, Hugo Thienpont, Jurgen Van Erps, Michael Vervaeke
Citation
M. Re et al., “Production of InorganicThin Scintillating Films for Ion Beam Monitoring Devices,” 2005, pp. 808–810.
Abstract In this work we present the development of beam monitoring devices consisting of thin CsI(1) films deposited on Aluminium support layers. The light emitted by the scintillating layer during the beam irradiation is measured by a CCD-camera. In a first prototype a thin Aluminium support layer of 6 micron allows the ion beam to easily pass through without significant energy loss and scattering effects. Therefore it turns out to be a non-destructive monitoring device to characterize on-line beam shape and beam position without interfering with the rest of th irradiation process. A second device consists of an Aluminium support layer which is thick enough to completely stop the impinging ions allowing to monitor at the same time the beam profile and the beam current intensity. Some samples have been coated by a 100 A protective layer to prevent the film damage by atmosphere exposition. In this contribution we present our experimental results obtained by irradiating the samples with proton beams at 8.3 an 62 MeV. We also propose some innovative applications of these beam monitoring devices in different nuclear sectors such as cancer proton therapy and high intensity beam accelerators.
Looking for photonics STEM activities? Visit our new site
B-Photonics

Contact

Hugo Thienpont
Prof. Dr. Ir.
Hugo Thienpont
Managing Director
Nadia Cornand

Nadia Cornand
Secretary
ncornand@b-phot.org
+32 2 791 68 52

How to reach B-Phot?

VUB - Campus Etterbeek
Pleinlaan 2
1050 Elsene
Building F - 9th floor

More info